9 February 2018
CRAIC’s microspectrophotometers offered with enhanced PL microspectroscopy
© Semiconductor Today Magazine / Juno PublishiPicture: Disco’s DAL7440 KABRA laser saw.
CRAIC Technologies Inc of San Dimas, CA, USA is now offering enhanced photoluminescence (PL) microspectroscopy.
Users of the 20/30 PV and Apollo II microspectrophotometers now have the ability to acquire PL spectra and images of microscopic sample areas throughout the ultraviolet (UV), visible and near-infrared (NIR) regions. Additionally, PL-equipped CRAIC microspectrophotometers can be used to monitor the time dependences of these spectra using the firm’s kinetic software TimePro or map the PL emission from large-scale objects with microscopic spatial resolution.
“Many of the novel nanoparticles and films being developed are characterized by their photoluminescent microspectra. New microscopic devices utilizing photoluminescence are also under development,” says president Dr Paul Martin. “As such, the ability to test those devices with ultra-high spatial resolution and fidelity becomes increasingly important,” he adds. “Microspectrometers can quickly characterize and qualify photoluminescence so as to allow for researchers and manufacturers to develop ever better devices.”