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30 September 2014

Microsanj launches 800ps-resolution thermal analyzer for high-speed devices

Microsanj LLC of Santa Clara, CA, USA, which provides high-resolution thermoreflectance imaging analysis (TIA) systems, tools and consulting services, has announced the availability of the NT410A high-performance thermal analyzer in its Thermoreflectance Nanotherm Series.

The TIA systems are based on the optical thermoreflectance principle coupled with digital signal processing and advanced software algorithms to support microelectronic component thermal characterization for thermal design validation, defect analysis, and reliability analysis. Microsanj claims to offer the highest-resolution thermal imaging systems on the market.

The firm says that the NT410A represents another step forward in the development of thermal analyzers capable of meeting the stringent requirements necessary to meet the challenges of complex high-performance microelectronics devices. With a time resolution of 800 picoseconds, sub-micron spatial, 1°C temperature resolution, and mega pixel full-field thermal images, the NT410A can provide device designers with key time-dependent thermal performance data that was, up to now, not easily attainable, says the firm. This information helps to ensure long-term device reliability and enables more optimal designs of ultra-fast logic devices, fast pulsed radar components, and other high-speed semiconductor devices, it adds.

“This latest addition to the Microsanj thermal imaging product line is the most advanced system available for thermal imaging", claims CEO Dr Mo Shakouri. “The NT410A has the capability for top-side and through-the-substrate thermal imaging with the accuracy and resolution necessary to fully characterize and analyze the thermal behavior of today's advanced high-performance semiconductor devices.”

A paper to be presented at the IEEE Compound Semiconductor IC Symposium (CSICS) in La Jolla, CA, USA on 20 October describes how the sub-nanosecond time resolution of the NT410A can be applied to ultrafast thermal imaging of high-power gallium nitride (GaN) transistors.

Tags: thermal analysis

Visit: www.microsanj.com

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