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15 November 2013

Integra approved by DLA for MIL-STD-750 processing

Semiconductor test and services firm Integra Technologies says that its facility in Wichita, KS, USA has been approved by the US Defense Logistics Agency (DLA) Land and Maritime to support screening to MIL-PRF-19500P and MIL-STD-750. The approval covers 76 individual test methods.

Additionally, Integra claims to be the only test lab to have MIL-STD-750 suitability for the following test methods:

1036 - Intermittent Operation Life;

3261 - Extrapolated unity-gain frequency;

3475 - Forward transconductance of power MOSFETS or IGBT;

3501 - Breakdown voltage, drain-to-source;

3505 - Maximum available gain of a GaAs FET;

3510 - 1dB compression point of a GaAs FET;

3570 - GaAs FET forward gain (Mag S21);

3575 - Forward transconductance.

4101 - Conversion loss.

“When this capability is added to our existing extensive MIL-STD 883 capability, and combined with our recent purchase of Analytical Solutions Inc [which provides semiconductor device evaluation services through destructive physical analysis, construction analysis, failure analysis, non-destructive testing and counterfeit device investigation], we now have one of the industry’s broadest semiconductor test and evaluation service offerings,” reckons president Becky Craft.

Tags: GaAs FET

Visit: www.integra-tech.com

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