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19 February 2013

Evergreen Enhancement announces free materials measurement service

Metrology system maker Evergreen Enhancement Inc of Canton, MA, USA says that it is offering semiconductor manufacturers an opportunity to sample a variety of characteristics of its products for free.  

“For a limited time, semiconductor makers have the opportunity to sample precise thickness, relative shape and local variations of a number of substrate wafers using our unique new metrology technique and equipment - at no cost,” says president Bill Kerr.

“Applying the proven consumer marketing technique of ‘try-before-you-buy’, the accuracy, speed and ease of use of our new approach and equipment can become compelling,” Kerr reckons. “Our objective is to leapfrog competitive measurement services and gain traction in this dynamic marketplace,” he adds. “Using Evergreen Enhancement for metrology needs frees up a semiconductor manufacturer’s valuable engineering staff to continue the development of next-generation processes and products.”

Evergreen says that its free measurement service is suited to compound semiconductor, LED, gallium nitride (GaN), silicon and sapphire materials.

The firm adds that its team of engineers has expertise in mechanical, electrical, software and component engineering as well as system integration.

Tags: Metrology


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