3 September 2012
CRAIC Technologies introduces Spectral Surface Mapping
UV-visible-NIR microscope and microspectrometer manufacturer CRAIC Technologies of San Dimas, CA, USA, has introduced Spectral Surface Mapping (S2M) capabilities for its Perfect Vision microspectrophotometer line. S2M gives CRAIC microspectrometer users the ability to map the spectral variation of surfaces with microscopic spatial resolution, says the firm. Surface profiles can be created using UV-visible-NIR transmission, absorbance, emission, fluorescence and polarization microspectral data. S2M can even create maps from Raman microspectral data from the CRAIC Apollo Raman microspectrometer.
“CRAIC Technologies has worked to develop the Spectral Surface Mapping package because of customer requests. Our customers wanted the ability to automatically survey and characterize the entire surface of samples by their spectral characteristics. They also wanted a high spatial resolution” states Dr Paul Martin, president of CRAIC Technologies. “The S2M package does just that. It allows you to collect spectral data from thousands of points with a user defined mapping pattern. And because our customers deal with so many different types of microspectroscopy, we gave S2M the ability to map UV-visible-NIR transmission, absorbance, reflectance, emission and even Raman microspectra all with the same tool.”
Spectral Surface Mapping includes a software module to be used with CRAIC Technologies MINERVA microspectrometer control software. When used with CRAIC Technologies microspectrometers with programmable stages, S2M allows users to automatically take spectral measurements with user-defined mapping patterns that reach to the limits of the stage itself. With the ability to measure up to a million points, high definition maps of the spectral response of the surface of a sample may be generated.