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<title>Corning probes optical losses in nitride laser at wafer level</title>
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Corning researchers finds that holes bound to Mg acceptors dominate waveguide loss in blue-green nitride lasers.


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<pubDate>Sun, 06 Feb 2011 14:18:30 +0000</pubDate>
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<title>SiN raises nitride HEMT breakdown voltage without current collapse</title>
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Bilayer approach uses combinations of different SiN films as passivation.


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<pubDate>Sun, 06 Feb 2011 14:19:30 +0000</pubDate>
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<title>Power, speed and other highlights at IEDM</title>
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Mike Cooke rounds up developments reported at December’s 2010 IEEE International Electron Devices Meeting (IEDM) in San Francisco.


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<pubDate>Sun, 06 Feb 2011 14:20:15 +0000</pubDate>
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