Temescal

Semigas

CLICK HERE: free registration for Semiconductor Today and Semiconductor Today ASIACLICK HERE: free registration for Semiconductor Today and Semiconductor Today ASIA

Join our LinkedIn group!

Follow ST on Twitter

IQE

18 July 2018

Reedholm collaborates with Texas State University on production test of wide-bandgap devices

© Semiconductor Today Magazine / Juno PublishiPicture: Disco’s DAL7440 KABRA laser saw.

Reedholm Systems of Georgetown, near Austin, TX, USA (which provides parametric and reliability test systems, including those designed for high-power wide-bandgap requirements) has formally engaged with The Piner Research Group on the Texas State University Campus to develop reliability methods and standards for production test of wide-bandgap (WBG) devices as well as to provide technical consulting services to Reedholm Systems.

The group of Dr Eddie Piner is principally focused on research and technology development in the growth and characterization, semiconductor fabrication, and performance optimization and reliability of wide-bandgap materials for solid-state device applications.

Prior to joining Texas State University, Piner spent a decade as director of Advanced Technology for WBG device maker Nitronex LLC. He also worked as a research engineer and project manager at ATMI, specializing in III-nitride epitaxial processes.

The parties recognize the unique needs and challenges faced by WBG device makers and Reedholm Systems‘ need to refine its measurement instrumentation and long-term reliability stress capabilities specifically for the gallium nitride (GaN), silicon carbide (SiC), gallium nitride on silicon (GaN on Si) and other WBG devices and materials.

The terms of the agreement with The Piner Research Group also call for Reedholm to install one of its 10kV/50A WBG Parametric Test Systems for process control and die sort measurements of WBG devices. The system can also be extended for reliability stress test requirements for high-temperature operation lifetime (HTOL), high-temperature reverse bias (HTRB) and high-temperature gate bias (HTGB) requirements for WBG research projects undertaken by Reedholm Systems personnel, the Piner Research Group and Texas State University PhD students.

Tags: Wide-bandgap electronics GaN SiC Semiconductor test instrument

Visit: www.reedholmsystems.com

Visit: www.msec.txstate.edu/Research/TETF-Laboratories/

Share/Save/Bookmark
See Latest IssueRSS Feed

AXT