Temescal

Semigas

CLICK HERE: free registration for Semiconductor Today and Semiconductor Today ASIACLICK HERE: free registration for Semiconductor Today and Semiconductor Today ASIA

Join our LinkedIn group!

Follow ST on Twitter

IQE

28 May 2014

Lake Shore's IMS exhibit to feature high-frequency probing and characterization technology

Lake Shore Cryotronics Inc of Westerville, near Columbus, OH, USA, which makes scientific sensors, instruments and systems for measurement and control, is exhibiting in booth 1352 at the IEEE MTT International Microwave Symposium (IMS 2014) in Tampa Bay, FL (3–5 June), where it will discuss platforms that enable the study of devices and materials using high-frequency measurements.

Platforms include Lake Shore’s probe stations for non-destructive probing of materials and test devices, whether for the study of electrical, magneto-transport, DC, RF or microwave properties. Applications include carbon-based nanotube (CNT), graphene, MEMS, gallium-nitride (GaN), silicon-germanium (SiGe), superconducting device and organic semiconductor research.

Lake Shore’s probe stations are specifically designed for on-wafer probing and measurement of device samples as a function of temperature and field. Interrogating samples at cryogenic temperatures and in high magnetic fields can reveal certain mechanisms of novel materials, particularly in semiconductor and nanoscale device research. Low-temperature operation is becoming increasingly important in the development of new electronic devices, including high-speed SiGe-based transistors, says Lake Shore.

Lake Shore offers four cryogen-free CCR probe stations and six liquid cryogen models, as well as a wide selection of probes, sample holders, and other options to enable users to configure a station for a specific application. Among these are ground-signal-ground (GSG) style probes, available for 40GHz or 67GHz frequency ranges and designed to ensure optimal microwave measurement performance at cryogenic temperatures.

In addition, Lake Shore is currently working with several companies and university researchers towards the development of terahertz-frequency, on-wafer contact probing for cryogenic applications. The goal is to enable high-speed device probing and performance measurements at variable temperatures and fields for next-generation electronics R&D.

Lake Shore is also discussing its new turnkey Model 8501 THz system for non-contact characterization of materials at variable temperature and in high field. The complete platform features an integrated high-field cryostat and specially designed continuous wave (CW) THz emitter and detector components, supporting the ability to measure at higher frequencies (200GHz to 1.5THz). CW THz spectroscopy can reveal properties that other techniques miss because many phenomena have been found to align with these frequencies, and it offers particular potential for characterizing dielectric materials for high-frequency and waveguiding applications, says Lake Shore.

See related items:

Lake Shore showcasing cryogenic probe stations at MRS Spring

Lake Shore launches integrated system for THz materials characterization

Tags: Lake Shore

Visit: www.ims2014.org

Visit: www.lakeshore.com/products/THz-System

Share/Save/Bookmark
See Latest IssueRSS Feed

AXT